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Elyse Rosenbaum is an American electrical engineer, the Melvin and Anne Louise Hassebrock Professor in Electrical and Computer Engineering at the University of Illinois Urbana-Champaign, and the director of the Center for Advanced Electronics through Machine Learning.[1] Her research involves the reliability of integrated circuits, including modeling the effects of heat, electrostatic discharges, aging, and other forms of stress on semiconductor-based circuit components.[2]
Rosenbaum earned a bachelor's degree from Cornell University and a master's degree from Stanford University, in 1984 and 1985 respectively,[3] and became a researcher at Bell Labs.[2] Returning to graduate study, she completed a Ph.D. in 1992 at the University of California, Berkeley.[1] Her dissertation, Thin oxide reliability in integrated circuits, was supervised by Chenming Hu.[3]
She has been a faculty member at the University of Illinois Urbana-Champaign since 1992,[2] and was named Melvin and Anne Louise Hassebrock Professor in 2016.[1]
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Rosenbaum was named an IEEE Fellow in 2011, "for contributions to electrostatic discharge reliability of integrated circuits".[4]
She received the Industry Pioneer Award in 2017, at the 39th Electrical Overstress/Electrostatic Discharge Symposium (EOS/ESD).[5]
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