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Rasterchraftmikroskoop
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S Rasterchraftmikroskoop, sältener Atomchraftmikroskoop (ängl. atomic/scanning force microscope; abkürzt AFM bzw. SFM, sältener RKM), isch e speziells Rastersondemikroskoop. Es isch e wichdigs Wärkzüüg in dr Ooberflechechemii und mä brucht s, zum Oberfleche mechanisch abzdaste und zum atomari Chreft uf dr Nanometerskala z mässe. Das Mikroskoop isch 1986 vom Gerd Binnig, Calvin Quate und Christoph Gerber[1] entwigglet worde.
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